Schulung
Datum: 18/02/2025 - 19/02/2025
Ort: Nuremberg, Deutschland
Fachliche Leitung:
Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart
Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org
Registration Deadline: 11 February 2025
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This tutorial aims to provide an introduction to the basic measurement techniques used to test and characterize power semiconductor devices. Participants will gain a fundamental understanding of which measurements are needed to characterize a power electronic semiconductor and the measurement principles that are used as the basis. We will also discuss the relevance and informational value of data sheet parameters and provide insight into how to use this information.
During the presentations, experiments will be demonstrated to provide practical examples.
Aims
Target group
This tutorial is mainly meant for
All presentations and discussions will be in English language.
Schulung
Datum: 18/02/2025 - 19/02/2025
Ort: Nuremberg, Deutschland
Fachliche Leitung:
Prof. Dr.-Ing. Ingmar Kallfass, University of Stuttgart
Organisation:
Krista Schmidt
+49 911 81 02 88 - 16
krista.schmidt(at)ecpe.org
Registration Deadline: 11 February 2025
© 2019 Cluster Leistungselektronik im ECPE e.V.